节点文献

Optimization of inductively coupled plasma etching for low nanometer scale air-hole arrays in two-dimensional GaAs-based photonic crystals

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 彭银生叶小玲徐波金鹏牛洁斌贾锐王占国

【Author】 Peng Yinsheng Ye Xiaoling Xu Bo Jin Peng Niu Jiebin Jia Rui Wang Zhanguo (1 Key Laboratory of Semiconductor Materials Science,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China) (2 Institute of Microelectronics,Chinese Academy of Sciences,Beijing 100029,China)

【机构】 Key Laboratory of Semiconductor Materials Science,Institute of Semiconductors,Chinese Academy of SciencesInstitute of Microelectronics,Chinese Academy of Sciences

【摘要】 <正>This paper mainly describes fabrication of two-dimensional GaAs-based photonic crystals with low nanometer scale air-hole arrays using an inductively coupled plasma(ICP) etching system.The sidewall profile and surface characteristics of the photonic crystals are systematically investigated as a function of process parameters including ICP power,RF power and pressure.Various ICP powers have no significant effect on the verticality of air-hole sidewall and surface smoothness.In contrast,RF power and chamber pressure play a remarkable role in improving sidewall verticality and surface characteristics of photonic crystals indicating different etching mechanisms for low nanometer scale photonic crystals.The desired photonic crystals have been achieved with hole diameters as low as 130 nm with smooth and vertical profiles by developing a suitable ICP processes.The influence of the ICP parameters on this device system are analyzed mainly by scanning electron microscopy.This fabrication approach is not limited to GaAs material,and may be efficiently applied to the development of most two-dimensional photonic crystal slabs.

【Abstract】 This paper mainly describes fabrication of two-dimensional GaAs-based photonic crystals with low nanometer scale air-hole arrays using an inductively coupled plasma(ICP) etching system.The sidewall profile and surface characteristics of the photonic crystals are systematically investigated as a function of process parameters including ICP power,RF power and pressure.Various ICP powers have no significant effect on the verticality of air-hole sidewall and surface smoothness.In contrast,RF power and chamber pressure play a remarkable role in improving sidewall verticality and surface characteristics of photonic crystals indicating different etching mechanisms for low nanometer scale photonic crystals.The desired photonic crystals have been achieved with hole diameters as low as 130 nm with smooth and vertical profiles by developing a suitable ICP processes.The influence of the ICP parameters on this device system are analyzed mainly by scanning electron microscopy.This fabrication approach is not limited to GaAs material,and may be efficiently applied to the development of most two-dimensional photonic crystal slabs.

【基金】 supported by the State Key Development Program for Basic Research of China(Nos.2006CB604904,2006CB604908);the National Natural Science Foundation of China(Nos.60676029,60990315,60625402).
  • 【文献出处】 半导体学报 ,Journal of Semiconductors , 编辑部邮箱 ,2010年01期
  • 【分类号】O734
  • 【被引频次】1
  • 【下载频次】130
节点文献中: 

本文链接的文献网络图示:

本文的引文网络