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电子束辐照防治储粮害虫及对小麦品质影响的研究
EFFECTS OF ELECTRON BEAM IRRADIATION ON PEST-CONTROL AND WHEAT QUALITY ANALYSIS IN BULK GRAIN STORAGE
【摘要】 利用电子束动态辐照的方法对我国南方主要储粮害虫米象、谷蠹、赤拟谷盗等的辐照感应性及致死剂量进行了研究,同时对辐照后小麦的品质进行了分析.研究结果表明,经过0.3kGy和0.6 kGy低剂量电子束辐照后能够有效防治储粮害虫,4~5周内,0.3 kGy剂量对3种试验虫种的致死率为100%,而0.6 kGy剂量辐照后成虫在一周内死亡率达100%,成虫对电子束辐照的敏感性分别为米象>赤拟谷盗>谷蠹.辐照后对小麦发芽率和发芽势有所影响,小麦(面粉)品质变化不明显,辐照样品的面团流变学特性、面筋指数和气味色泽没有明显变化.
【Abstract】 The effects of the dynamic electron beam irradiation on insects as Sitophilas Oryzae Linnaeus,Rhizopertha dominica Fabricius and Tribolium Herbst hidden in stored bulk wheat and the quality of irradiated wheat were investigated.The results showed that 0.3 kGy and 0.6 kGy were effective doses to prevent and control stored grain insects.Adults on the sensitivity of electron beam irradiation,respectively,as Sitophilas Oryzae Linnaeus > Tribolium Herbst > Rhizopertha dominica Fabricius.No living insects or pupae were found after 5 weeks with the radiation dose of 0.3 kGy.While the mortality rate of samplers was 100% with the radiation dose of 0.6 kGy in a week.The basic quality parameters including the color and smell of wheat flour,rheological properties and gluten index of dough etc.have not changed except some potential unobvious affect on germination rate and vigor after low-dose electron beam irradiation.
【Key words】 low dose; electronic beam; dynamic irradiation; stored grain; insect;
- 【文献出处】 河南工业大学学报(自然科学版) ,Journal of Henan University of Technology(Natural Science Edition) , 编辑部邮箱 ,2009年04期
- 【分类号】TS211
- 【被引频次】30
- 【下载频次】214