【摘要】 研究建立了ICP-AES同时测定磁制冷材料钆硅锗系合金中Mo,Mn,Al,V,Ni,Cu,Ga,Fe,Ca(含量范围为质量分数0.1%～1%)9种杂质元素的分析方法。方法的检出限为0.003～0.1μg.ml-1,测定下限为0.02～0.5μg.ml-1,回收率在94%～108%,对于杂质质量分数为0.1%,0.5%,1.0%的样品,其RSD分别为0.40%～2.6%,0.52%～1.1%,0.67%～1.3%,结果表明该方法的精密度和准确度均满足微量分析的要求。更多还原

【Abstract】 A new method for determination of trace elements,such as Mo,Mn,Al,V,Ni,Cu,Ga,Fe and Ca in magnetic refrigeration material,GdSiGe series alloys,was developed with ICP-AES.Detection limit and determination limit of the method were 0.003～0.1 g·ml-1 and 0.02～0.5 g·ml-1 respectively.The recovery rate was 94%～108%.The relative standard deviations(n=10) of the sample(the content of impurity was 0.1%,0.5%,1.0%) were 0.40%～2.6%,0.52%～1.1%,0.67%～1.3%,respectively.The results showed that the method had good accuracy and precision,and could meet the requirements of microanalysis.更多还原