【摘要】 针对太空环境下粒子辐射引发的软错误已经成为芯片失效的主导原因,提出一种容软错误锁存器结构——D IL-SET。该结构在内部构建基于C单元的双模互锁结构,针对单事件翻转进行防护。ISCAS-89标准电路在UMC 0.18μm工艺下的实验表明,使用D IL-SET代替未经加固的静态锁存器,面积开销增加4.99%~53.47%,软错误率平均下降99%以上。更多还原

【Abstract】 Radiation induced soft errors have become the predominant issues for aero applications.This paper presents a dual interlocked latch for soft-error-tolerance(DIL-SET).The proposed DIL-SET can effectively mitigate single event upset by interlocked use of code word state preserving element.The experiment results on ISCAS-89 benchmarks in UMC 0.18μm process show that area overhead is ranging from 4.99% to 53.47%,and reduction of soft error rate averages 99%.更多还原