【摘要】 为研究样品测试表面位置对碳材料XRD衍射峰特征和微结构的影响,采用θ-θ模式运行的X射线衍射仪对块状中间相沥青基碳材料进行了表征,并分析了测试样品表面高低对XRD衍射峰峰形和碳材料微结构参数的影响。结果表明:测试样品表面位置对碳材料的衍射峰峰形和碳材料微结构参数产生很大影响,主要表现为衍射峰强度显著降低、峰位置有较大偏移、峰半高宽有较大变化,造成了根据这些参数计算的碳材料微结构参数有较大变化。这些影响与X射线衍射仪的工作原理有关,因此在利用XRD测试样品时需要严格控制样品表面在标准测试位置上。更多还原

【Abstract】 In order to clarify the influence of the tested surface altitude on the XRD peak features and the microstructure parameters of carbon material,an X-ray diffractometer,working in the mode of θ-θ,was used to characterize a bulk mesophase pitch-based carbon material.It was found that the tested surface altitude possessed significant influence on the XRD peak features and the microstructure parameters of carbon material.For example,the intensity of diffraction peak decreased obviously,the position of diffraction peak shifted to a large degree and width at half height of the peak changed greatly.These changes in peak features further caused the large variation in the microstructure parameters.These changes in peak features occurred on X-ray diffractometers due to their inherent working mechanism.Therefore,the surfaces of samples must be placed on the standard levels during testing.更多还原