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基于NiosⅡ/SOPC的嵌入式数字IC测试
Embedded Digital IC Testing Based on NiosⅡ/SOPC
【摘要】 为实现数字IC故障检测的SOPC设计,在Altera-Cyclone EP1C6Q240中嵌入软核处理器NiosⅡ,用继电器EC2-5NW2阵列完成各引线的通用控制,在NiosⅡ控制下离线完成了对常用TTL74/54、CMOS 4000/4500系列常用数字IC芯片故障检测。文中详细介绍了系统结构、引脚控制,讲述了NiosⅡ-FPGA/SOPC的设计思想和实现方法。实验效果好,实践表明该设计是切实可行的。
【Abstract】 A design was introduced to realize SOPC design of digital IC error detection,in which soft core processor Nios Ⅱ was embedded in Altera-Cyclone EP1C6Q240,EC2-5NW2 array to accomplish fuse control for common pins.It could test the error for common chips such as the series of TTL 74/54 and CMOS 4000/4500 off-line by Nios Ⅱ.The system structure and control of pin were mainly discussed,the Nios Ⅱ-FPGA/SOPC design principle and realizing method were also presented.The experiment effect was good,the practice showed the design was feasible.
【Key words】 detection on digital IC; FPGA/SOPC; soft core processor Nios Ⅱ; intelligent control;
- 【文献出处】 仪表技术与传感器 ,Instrument Technique and Sensor , 编辑部邮箱 ,2009年06期
- 【分类号】TN407
- 【被引频次】7
- 【下载频次】124