【摘要】 测试功耗问题是当今深亚微米芯片设计领域研究的热点,低功耗测试向量产生技术能够产生低功耗测试向量,且不需要对设计进行内在修改.文中分析了低功耗测试的重要性及现有低功耗测试向量产生方法,从外部测试、内建自测试和测试数据压缩技术三方面分析了低功耗测试向量产生技术的基本思路、研究现状及其优缺点,提出连续测试向量间的相关性是低功耗测试向量产生技术的关键问题.更多还原

【Abstract】 Excessive power during test affects the reliability of digital integrated circuits,test throughput and manufacturing yield.Numerous low power test pattern generation methods have been investigated over the past decade.This paper introduces the topic of low power test and overviews the basic techniques and some recent advancements in the field of low power test pattern generation techniques.更多还原