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SrTiO3基片上Tl-2212双晶约瑟夫森结的动态特性及噪声影响研究

Dynamic characteristics of Tl-2212 bicrystal Josephson junctions on SrTiO3 substrates and the effect of noise on it

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【作者】 王争岳宏卫周铁戈赵新杰何明谢清连方兰阎少林

【Author】 Wang Zheng 1) Yue Hong-Wei 1)Zhou Tie-Ge 1)Zhao Xin-Jie 1)He Ming 1)Xie Qing-Lian 1)2)Fang Lan 1)Yan Shao-Lin 1)1)(Department of Electronics,College of Information Technical Science,Nankai University,Tianjin 300071,China)2)(Department of Physics and Electronic Information Science,Guangxi Teachers Education University,Nanning 530001,China)

【机构】 南开大学信息技术科学学院电子系广西师范学院物理与电子信息科学系

【摘要】 在SrTiO3(STO)基片上制作了Tl-2212双晶约瑟夫森结,并对其进行了微波辐照下的I-V特性测试,观察到了夏皮罗台阶,符合约瑟夫森电压-频率关系.利用数值仿真对约瑟夫森结建立了RCSJ模型,仿真结果与实验数据符合较好,利用此模型深入研究了噪声对结动态特性的影响,解释了噪声影响下结的微波感应台阶幅度减小和极小值展宽现象,提出了有效噪声温度为工作温度和外部噪声的等效温度之和.

【Abstract】 Tl-2212 bicrystal Josephson junctions on SrTiO3 substrates have been fabricated.The I-V characteristic of a Josephson junction under microwave radiation were measured,and microwave induced steps were observed in accordance with the Josephson frequency-voltage relationship.The RCSJ model including noise of bicrystal Josephson junction was constructed through numerical simulation,and the results of simulation were in good agreement with the experimental data.Using the RCSJ model,we investigated the effect of noise on the dynamic characteristics of Josephson junction through simulation,and explained the phenomenon of reduced height and increased breadth of the minima of microwave induced steps.We proposed that the effective noise temperature should be the sum of operational temperature and equivalent temperature of the external noise.

【基金】 国家重点基础研究发展计划(批准号:2006CB601006);国家高技术研究发展计划(批准号:2006AA03Z213);高等学校博士学科点专项科研基金(批准号:20050055028,200800551009)资助的课题~~
  • 【文献出处】 物理学报 ,Acta Physica Sinica , 编辑部邮箱 ,2009年10期
  • 【分类号】TM26
  • 【被引频次】2
  • 【下载频次】84
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