【摘要】 研究了电子级磷酸中痕量硫酸根的分光光度测定法。实验结果表明,在波长为460 nm处,硫酸根含量与吸光度成良好的线性关系;随着磷酸取样量的增加,吸光度达到稳定值所需的时间相应增加,稳定后磷酸取样量与硫酸根含量成良好线性关系,因此实验过程中可通过调整磷酸的取样量来调节硫酸根含量,使之在标准曲线的测定范围内。实验可测定的硫酸根的质量浓度范围为2~12μg/mL,硫酸根质量分数范围为(8~300)×10-6。还研究了稳定剂对吸光度的影响,测定了硫酸根的回收率,验证了实验方法的可靠性。更多还原

【Abstract】 The trace amount SO2-4 in electronic grade phosphoric acid was determinated by spectrophotometry.Experimental result showed that under the wavelength of 460 nm,there was good linear relation between absorbency and content of SO2-4;and stationary time that absorbency value needed became longer along with the increase of sample quantity of phosphoric acid.When absorbency become stationary,there is good linear relation between the phosphoric acid sample quantity and the content of SO2-4.So the content of SO2-4 can be adjusted by turning the sample quantity to make it in scope of standard curve.Mass concentration range of SO2-4 that can be determinated is 2~12 μg/mL,and mass fraction range of SO2-4 is(8~300)×10-6.Impact of stabilizer on absorbency was also studied.In addition,the recovery rate of SO2-4 was determined and the reliability of this experiment method was checked.更多还原