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晶体硅太阳电池在线旁路结的测试与分析
IN-LINE MEASUREMENTS AND ANALYSE FOR THE CRYSTALLINE SILICON SOLAR CELL SHUNTS
【摘要】 描述了利用热敏变色液晶片制作的测旁路结的简易设备,并利用该设备详细分析了太阳电池制备过程中产生的边缘结、肖特基结以及由金属污染、刮痕或裂缝而引起的旁路结情况。实验表明利用该设备可以快速判断出引起晶体硅电池效率降低的原因,这对于太阳电池生产实时检测和工艺调整具有很好的作用。
【Abstract】 The efficiency of the solar cell can be degraded drastically by the shunts,some of which were originated from silicon material,but the most important shunts were induced by process.The simple measurement which can image the shunts directly was described by using the temperature sensitive liquid crystal sheet.Through analyzing all the major process -induced shunts in details,such as edge shunts,Schottky shunts,contamination-originated shunts,and so on,the reasons which influencing the efficiency of the solar cell can be deduced exactly.
【关键词】 太阳电池;
旁路结;
热敏变色液晶片;
【Key words】 solar cell; shunt; temperature sensitive liquid crystal sheet;
【Key words】 solar cell; shunt; temperature sensitive liquid crystal sheet;
【基金】 国家高技术研究发展计划(863)项目(2006AA05Z409)
- 【文献出处】 太阳能学报 ,Acta Energiae Solaris Sinica , 编辑部邮箱 ,2009年08期
- 【分类号】TM914.4
- 【被引频次】1
- 【下载频次】169