节点文献

填样深度对多晶粉末X射线衍射仪测试结果的影响研究

Study on Effect of Fill-sample Depth on Determination with Polycrystal Powder X-ray Diffractometer

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 程国峰杨传铮张健

【Author】 CHENG Guo-feng1,YANG Chuan-zheng2,ZHANG Jian2(1.Analysis & Testing Center for Inorganic Materials,Shanghai Institute of Ceramics,Chinese Academy of Sciences,Shanghai 200050,China;2.Shanghai Institute of Micro-system and Information Technology,Chinese Academy of Sciences,Shanghai 200050,China)

【机构】 中国科学院上海硅酸盐研究所无机材料分析测试中心中国科学院上海微系统与信息技术研究所

【摘要】 从理论和实验两个角度研究了填样深度对多晶粉末X射线衍射仪中实验结果——峰位、半高宽(FWHM)、衍射强度的影响。结果表明,在对称反射几何情况下,金属及其合金样品填样深度效应可以忽略,填样深度在0.2~0.5mm范围内能满足无穷厚度要求;对于绝大多数有机样品填样深度应不小于1.5mm。

【Abstract】 The influences of fill-sample depth on experimental results,such as peak position,half high width(FWHM) and diffraction intensity were investigated theoretically and experimentally with powder X-ray diffractometer.Results showed that the effect of fill-sample depth on metal and alloy could be neglected under symmetry reflection geometry.The fill-sample depth at the range of 0.2-0.5 mm could meet the requirement of infinitude thickness.For most of organic samples,the fill-sample depth should be greater than 1.5 mm.

  • 【文献出处】 分析测试学报 ,Journal of Instrumental Analysis , 编辑部邮箱 ,2009年03期
  • 【分类号】TH744
  • 【被引频次】6
  • 【下载频次】311
节点文献中: 

本文链接的文献网络图示:

本文的引文网络