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纳米磁性膜微波磁谱测量微带线系统的优化设计

Optimization Design of Microstrip-Line System for Measurement of Permeability Spectrum of Nanostructural Magnetic Film

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【作者】 邓联文陈鸿飞安维江建军张秀成

【Author】 DENG Lian-wen1,CHEN Hong-fei1,AN Wei2,JIANG Jian-jun3,ZHANG Xiu-cheng3(1.School of Physics Science and Technology,Central South University,Changsha 410083,China;2.Huizhou Bureau of Fire Control,Chief Team of Public Security and Fire Control of Guangdong,Huizhou 516001,China;3.Department of Electronic Science and Technology,Huazhong University of Science and Technology,Wuhan 430074,China)

【机构】 中南大学物理科学与技术学院广东省公安消防总队惠州消防局华中科技大学电子科学与技术系

【摘要】 磁性薄膜微波磁导率的扫频测量对研究开发高频软磁材料和薄膜吸波材料都具有十分重要的意义.围绕微波磁谱测量微带线系统的优化设计,主要研究微带线短路法测量薄膜磁谱使用的测量夹具的设计与制作.首先根据测试要求确定夹具设计方案,再利用高频电磁场仿真软件HFSS对微带线结构夹具进行性能仿真与设计优化,最后按设计要求制作微带线结构夹具,并对测试效果进行了分析评价.结果表明,设计开发的微带线结构夹具能满足0.05~5GHz频段磁导率的测量精度要求,反射系数S11的测量误差小于1.4%.

【Abstract】 Measurement of permeability spectrum in the microwave range is essential to the development of soft magnetic film and thin microwave absorber.Focusing on optimization design of microstrip-line system for measurement of microwave permeability spectrum,design and manufacture of the testing clamp used in the micro~strip-line short circuit method were discussed in this paper.Design scheme of the testing clamp was put forward firstly.Then,simulation and optimization of the testing clamp were accomplished with the software of HFSS for electromagnetic field emulation in the high frequency range.The testing clamp was processed and evaluated according to requirements of the design.Results show that the testing clamp can meet the measurement precision requirement in 0.05—5 GHz of the microstrip-line short circuit method with error of reflection coefficient S11 less than 1.4%.

【基金】 国家自然科学基金资助项目(60771028)
  • 【文献出处】 纳米技术与精密工程 ,Nanotechnology and Precision Engineering , 编辑部邮箱 ,2009年04期
  • 【分类号】TN604
  • 【被引频次】2
  • 【下载频次】172
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