【摘要】 针对集成电路特征尺寸进入纳米级后软错误率持续攀升的问题,本文以状态机拆分和三模冗余令牌为基础,提出更为可靠的自恢复控制器结构,并对典型基准电路进行了故障注入和仿真综合实验。结果表明,该结构以很小的硬件代价取得了更好的容错效果。更多还原

【Abstract】 As the feature sizes decrease to nm,the ever increasing soft error rate continues its stronger and stronger challenge to ICs such as controllers face.A more dependable self-recovering controller structure was presented based on finite state machine splitting and token hardened.The experimental results of fault injection,simulation and synthesis on some typical benchmarks show that the presented structure achieves a perfect soft error tolerant effect at a very low cost of hardware.更多还原