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SoC总线串扰的精简MT测试集

MT Compacted Set for Interconnect Crosstalk on SoC

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【作者】 张颖李华伟李晓维胡瑜

【Author】 Zhang Ying1,2,3) Li Huawei1,2) Li Xiaowei1,2) Hu Yu1,2)1)(Key Laboratory of Computer System and Architecture,Chinese Academy of Sciences,Beijing 100190)2)(Institute of Computing Technology,Chinese Academy of Sciences,Beijing 100190)3)(Graduate University of Chinese Academy of Sciences,Beijing 100049)

【机构】 中国科学院计算机系统结构重点实验室中国科学院计算技术研究所中国科学院研究生院

【摘要】 多跳变(MT)故障模型是一种有效的总线串扰故障模型,可以测试由电容和电感导致的串扰故障,但是MT的原始测试集存在严重的向量冗余.通过分析MT原始测试集向量冗余的3类情况,利用欧拉回路对测试向量进行组合优化,得到MT精简测试集,同时不损失MT故障覆盖率;还设计了MT故障模型的软件自测试程序来实施MT精简测试集,用于实速在线检测串扰故障,而不需要使用高速测试仪.实验结果表明,采用MT精简测试集可以有效地减少总线串扰测试的时间和向量存储开销.

【Abstract】 Multiple transition (MT) fault model is an effective fault model for both the capacitive and inductive coupling induced faults on bus. But the previously generated test set based on MT fault model tends to be redundant. In this paper,cases of the pattern redundancy of the MT test set are analyzed and classified into three types. Euler loop is then used to compact MT test patterns and get optimized MT compacted set without losing fault coverage. Then,a self-testing program for MT fault model is developed to apply the MT compacted set to on-line at-speed detecting of crosstalk-induced faults. Experimental results on the system of network card show that the test time and pattern storage overhead can be significantly reduced with the MT compacted test set.

【基金】 国家自然科学基金(60606008,60633060,60776031);国家“九七三”重点基础研究发展计划项目(2005CB321605);国家“八六三”高技术研究发展计划(2007AA01Z476)
  • 【文献出处】 计算机辅助设计与图形学学报 ,Journal of Computer-Aided Design & Computer Graphics , 编辑部邮箱 ,2009年04期
  • 【分类号】TN47
  • 【被引频次】4
  • 【下载频次】97
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