【摘要】 随着特征尺寸进入纳米尺度,相邻连线之间的电容耦合对电路的影响越来越大,并可能使得电路在运行时失效.为此提出一种面向受害线上最大串扰噪声的测试生成方法,该方法基于多串扰脉冲故障模型,能够有效地模型化故障并生成合适的向量.为了能够激活尽可能多的侵略线以造成受害线上的最大脉冲噪声,首先将测试生成问题转化为一个加权的最大可满足问题,再使用解题器求解,以得到测试向量;此外,将子通路约束加入到可满足问题的描述之中,以保证所有被激活的侵略线能够同时跳变.针对ISCAS89电路的实验结果显示,文中方法适用于较大规模电路的串扰噪声测试,并且具有可接受的运行时间.更多还原

【Abstract】 As the feature size continues to scale into the nanometer era,crosstalk-induced effect begins to exert a more significant influence and might cause a failure. We proposed a novel test generation method based on multiple crosstalk-induced glitch fault model (MCGF). This method can model the fault and generate proper patterns. In order to find the test activating aggressors as many as possible,we first map the objective of test generation into a weighted Max-SAT problem,and then solve it by using SAT solver to get required patterns. The sub-path constraints are added into the SAT problem to ensure that all activated aggressors switch simultaneously at the time the victim switches. Experiments on ISCAS89 benchmark circuit show that the proposed technique can be applied to circuits of reasonable sizes within acceptable time.更多还原