【摘要】 传统的广义霍夫变换空间复杂度及时间复杂度都很高,不适用于实时的应用。针对该问题,提出一种基于广义霍夫变换的芯片检测算法,降低了计算复杂度。该算法的主要思想是将多尺度分析与广义霍夫变换相结合。将该算法应用到自动光学检测系统的芯片检测中,取得了较好的检测结果。更多还原

【Abstract】 The time and space computing complexity of the traditional Generalized Hough Transform(GHT) is too high for real-time application, so a GHT is proposed in this paper.The computing complexity is reduced in this modified Hough algorithm.The basic idea of this algorithm is combining multi-scale analysis and GHT.To verify this algorithm, chip detection in Automatic Optical Inspection(AOI) system is performed.Test results prove to be good.更多还原