【摘要】 为了测量Z箍缩等离子体X射线的空间分辨光谱,利用椭圆聚焦原理,研制了一种椭圆晶体谱仪。以Si(111)椭圆弯晶作为色散分析元件,椭圆的离心率为0.9480,焦距为1348 mm,布拉格角范围为30°~54°,谱线探测角范围为54°~103°,探测的波长范围为0.31~0.51 nm。设计了半径为50 mm的半圆型胶片暗盒,内装胶片接收光谱信号。分析了椭圆的弥散度对光谱分辨率的影响。在"阳"加速器装置上进行摄谱实验,胶片成功获取了氩喷气等离子体X射线的跃迁光谱,实测谱线分辨率(λ/Δλ)达300~500,波长与理论值吻合。更多还原

【Abstract】 An elliptical crystal spectrometer has been developed based on elliptical focusing principle to diagnose spatial spectrum of X-ray of Z-pinch plasma.An elliptically bent Si(111) crystal was employed with 1348 mm focal length,0.9480 eccentricity,30°～54° Bragg angel,54°～103° viewing angle and 0.31～0.51 nm spectral range.A semicircle film carrier with 50 mm radius was designed to receive spectral signals.The influence of elliptical disperson on spectral resolution was analyzed.The first experiment was carried out on the Yang accelerator.The transition spectrum of Ar jet plasma X-ray was recorded.The measured wavelength is accorded with the theoretical value with spectral resolution λ/Δλ of 300～500.更多还原