【摘要】 非晶硅平板探测器(a-Si Flat Panel Detector)已在无损检测、医疗领域的连续式X光照相中得到了广泛应用,但在脉冲式(ns量级)闪光X光照相中的应用可行性及成像性能却未见报导。本文利用Varian公司生产的PaxScan 2520 HE型非晶硅平板探测器为接收系统,在450keV脉冲X光机上开展了闪光照相实验,考察了该探测器的应用可行性,测量了其探测灵敏度、像质计灵敏度、线扩散函数(LSF)及调制传递函数(MTF)。实验结果表明该探测器可应用于闪光X光照相,且探测灵敏度较高,空间分辨率较好,是一种有前景的闪光X光照相图像接收系统。更多还原

【Abstract】 Although a-Si FPD has proven to be quick and efficient for producing high quality digital images for continuous x-ray radiography,it has not been reported about the application feasibility of a-Si FPD in flash(from several to tens nanoseconds) x-ray radiography.In this paper,an a-Si FPD(Varian PaxScan 2520 HE) was used as imaging system in 450keV flash x-ray radiography to investigate the application feasibility.The detecting sensitivity was evaluated by step method.Imaging Quality Index(IQI) sensitivity was measured.Line spread function(LSF) and modulation transfer function(MTF) were acquired by knife-edge method and Fourier transform.The results demonstrated that a-Si FPD is an attractive detector for flash x-ray radiography with quality images.更多还原