【摘要】 随着CMOS器件进入纳米时代,测试时产生的功耗大大超过系统正常工作时的功耗,测试功耗已成为影响芯片设计的重要因素,芯片测试时的低功耗技术也已经成为当前学术界和工业界的一个研究热点。文章首先介绍了低功耗测试技术的基本概念,分析测试中的静态功耗和动态功耗;其次,分类介绍目前常用的测试功耗控制技术;然后,对研究热点的变化和技术发展的趋势做出说明。更多还原

【Abstract】 As CMOS device dimensions enter the nanometer era,test power has become much higher than the power produced in the circuit’s functional mode,so test power is going to have a very important impact on VLSI design,and it has already been a hot topic in the research and industry areas.In this paper,some concepts of low-power testing are introduced,and leakage power and dynamic power are explained respectively.Some primary low-power techniques are described,and the transformation of the research focus and the trend of technical development are also discussed.更多还原