【摘要】 为了测量喷气箍缩等离子体X射线的空间分辨光谱,利用椭圆聚焦原理,研制了一种椭圆晶体谱仪.分别利用Si(111)、Mica(002)椭圆晶体作色散元件,离心率均为0.9480,布喇格角为30～67.5°,光谱信号采用半径为50mm的半圆形胶片接收,从等离子体源经晶体到胶片的光路长为1430mm.在"阳"加速器装置上进行摄谱验证实验,成功获取了氩喷气等离子体X射线的光谱.测量光谱波长与理论值相符,其中Si弯晶获得的光谱分辨率(λ/Δλ=200～300)低于Mica弯晶获得的光谱分辨率(λ/Δλ=500～700).实验结果表明,该谱仪适合于喷气箍缩等离子体X射线的光谱学研究.更多还原

【Abstract】 To diagnose the presence of ion-beams in gas-puff pinch plasma,a new space resolved focusing elliptical curved crystal spectrometer was developed based on focusing spectrograph spatial resolution(FSSR).Si(111) and Mica(002) crystal were employed as dispersive elements with 0.948 0 eccentricity,which covered Bragg angels in the range of 30～67.5°.The experimental verification of the technique was carried out on the Yang accelerator facility and aimed to investigate the characteristics of high-density plasma.X-ray spectra in an Absolute intensity scale were obtained from argon gas-puff pinch plasmas recorded by a half-circle film with 50 mm radius.The long designed path of the X-ray spectrometer beam was 1 430 mm from the source to the crystal and the detector.It was demonstrated experimentally that the measured wavelength was consistent with the theoretical value,He-like spectral resolution λ/Δλ of 500～700 for the mica and λ/Δλ=200～300 for Si crystal spectrometers.It was also shown that the spectrograph of elliptical bent crystal was well suited to the analysis of the x-ray emission from a gas-puff pinch plasmas source.更多还原