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A charge allocating model for the breakdown voltage calculation and optimization of the lateral RESURF devices

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【作者】 李小刚冯志成张正元胡明雨

【Author】 Li Xiaogang1,Feng Zhicheng1,2,Zhang Zhengyuan1,2,and Hu Mingyu1(1 No.24 Research Institute of China Electronics Technology Group Corporation,Chongqing 400060,China)(2 National Laboratory of Analog IC,Chongqing 400060,China)

【机构】 No.24 Research Institute of China Electronics Technology Group CorporationNational Laboratory of Analog IC

【摘要】 A new quite simple analytical model based on the charge allocating approach has been proposed to describe the breakdown property of the RESURF(reduced surface field) structure.It agrees well with the results of numerical simulation on predicting the breakdown voltage.Compared with the latest published analytical model,this model has a better accuracy according to the numerical simulation with simpler form.The optimal doping concentration(per unit area) of the epi-layer of the RESURF structures with different structure parameters has been calculated based on this model and the results show no significant discrepancy to the data gained by others.Additionally the physical mechanism of how the surface field is reduced is clearly illustrated by this model.

【Abstract】 A new quite simple analytical model based on the charge allocating approach has been proposed to describe the breakdown property of the RESURF(reduced surface field) structure.It agrees well with the results of numerical simulation on predicting the breakdown voltage.Compared with the latest published analytical model,this model has a better accuracy according to the numerical simulation with simpler form.The optimal doping concentration(per unit area) of the epi-layer of the RESURF structures with different structure parameters has been calculated based on this model and the results show no significant discrepancy to the data gained by others.Additionally the physical mechanism of how the surface field is reduced is clearly illustrated by this model.

  • 【文献出处】 半导体学报 ,Journal of Semiconductors , 编辑部邮箱 ,2009年03期
  • 【分类号】TN386.1
  • 【被引频次】1
  • 【下载频次】52
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