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PI/介孔氧化硅复合材料的制备与性能研究

STUDY ON PREPARATION AND PERFORMANCES OF POLYIMIDE/MESOPOROUS SILICA COMPOSITES

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【作者】 赵春宝金鸿蒋文俊赵玮

【Author】 Zhao Chunbao1,Jin Hong1,Jiang Wenjun2,Zhao Wei1(1.Faculty of Microelectric Engineering,Nanjing College of Information Technology,Nanjing 210046,China;2.Key Laboratory for Soft Chemistry and Functional Materials of Ministry of Education,Nanjing University of Science and Technology, Nanjing 210094,China)

【机构】 南京信息职业技术学院微电子学院南京理工大学软化学与功能材料教育部重点实验室

【摘要】 通过四乙氧基硅烷的水解、缩合制备八(四甲基铵)倍半硅氧烷(TMA-POSS),以TMA-POSS为硅源,十六烷基三甲基溴化铵(CTAB)为模板剂,制备了六方有序纳米介孔氧化硅。采用原位聚合法制备了聚酰亚胺(PI)/介孔氧化硅复合材料,并讨论了介孔氧化硅的含量对PI材料的介电常数和热稳定性的影响。结果表明,加入介孔氧化硅有利于降低PI的介电常数和提高热稳定性,当其质量分数为5%时,PI/介孔氧化硅复合材料的介电常数可降至2.69。

【Abstract】 Octa(tetramethylammonium)-polyhedral oligomeric silsesquioxane(TMA-POSS) was synthesized by the hydrolysis and condensation of tetraethoxysilane.The mesoporous silica with well-ordered hexagonal pore structure was prepared using TMA-POSS as the silicon source and hexadecyltriethylammonium bromide(CTAB) as the template.Polyimide/mesoporous silica composites were prepared by in-situ polymerization.The effects of mesoporous silica content on the dielectric constant and thermal stability of polyimide were discussed.The results showed that the addition of mesoporous silica was propitious to reduction in dielectric constant and improvement in thermal stability for PI composites.The dielectric constant of the composite could be reduced to 2.69 by incorporating 5% mesoporous silica.

【基金】 江苏省高技术研究计划资助项目(BG2007047);南京信息职业技术学院基金重点资助项目(YKJ08-007)
  • 【文献出处】 工程塑料应用 ,Engineering Plastics Application , 编辑部邮箱 ,2009年08期
  • 【分类号】TB332
  • 【被引频次】4
  • 【下载频次】223
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