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Influence of patterned TiO2/SiO2 dielectric multilayers for back and front mirror facets on GaN-based laser diodes

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【作者】 陈伟华胡晓东代涛李睿叶学敏赵太平杜为民杨志坚张国义

【Author】 Chen Wei-Hua a),Hu Xiao-Dong a),Dai Tao a),Li Rui a),Ye Xue-Min b),Zhao Tai-Ping b),Du Wei-Min b),Yang Zhi-Jian a),and Zhang Guo-Yi a) a) State Key Laboratory for Mesoscopic Physics and Department of Physics,School of Physics,Peking University,Beijing 100871,China b) Institute of Modern Optics,School of Physics,Peking University,Beijing 100871,China

【机构】 State Key Laboratory for Mesoscopic Physics and Department of Physics,School of Physics,Peking UniversityInstitute of Modern Optics,School of Physics,Peking University

【摘要】 Ridge InGaN multi-quantum-well-structure (MQW) edge-emitting laser diodes (LDs) were grown on (0001) sapphire substrates by low-pressure metal-organic chemical vapour deposition (MOCVD).The dielectric TiO2/SiO2 front and back facet coatings as cavity mirror facets of the LDs have been deposited with electron-beam evaporation method.The reflectivity of the designed front coating is about 50% and that of the back high reflective coating is as high as 99.9%.Under pulsed current injection at room temperature,the influences of the dielectric facets were discussed.The threshold current of the ridge GaN-based LDs was decreased after the deposition of the back high reflective dielectric mirrors and decreased again after the front facets were deposited.Above the threshold,the slope efficiency of the LDs with both reflective facets was larger than those with only back facets and without any reflective facets.It is important to design the reflectivity of the front facets for improving the performance of GaN-based LDs.

【Abstract】 Ridge InGaN multi-quantum-well-structure (MQW) edge-emitting laser diodes (LDs) were grown on (0001) sapphire substrates by low-pressure metal-organic chemical vapour deposition (MOCVD).The dielectric TiO2/SiO2 front and back facet coatings as cavity mirror facets of the LDs have been deposited with electron-beam evaporation method.The reflectivity of the designed front coating is about 50% and that of the back high reflective coating is as high as 99.9%.Under pulsed current injection at room temperature,the influences of the dielectric facets were discussed.The threshold current of the ridge GaN-based LDs was decreased after the deposition of the back high reflective dielectric mirrors and decreased again after the front facets were deposited.Above the threshold,the slope efficiency of the LDs with both reflective facets was larger than those with only back facets and without any reflective facets.It is important to design the reflectivity of the front facets for improving the performance of GaN-based LDs.

【基金】 supported by the National High Technology Program of China (Grant No 2007AA03Z403);the National Natural Science Foundation of China (Grant Nos 60776042 and 60477011);National Basic Research Program of China (Grand No2006CB921607)
  • 【文献出处】 Chinese Physics B ,中国物理B , 编辑部邮箱 ,2008年09期
  • 【分类号】TN365
  • 【下载频次】17
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