【摘要】 针对发光二极管芯片检测系统位置配准的特殊性,建立了与之适应的位置配准模型。提出分步计算的方法,进行遗传算法优化,简化常规方法中的非线性求解问题。结果显示,该模型及其解法满足了发光二极管芯片位置配准要求,计算过程较为简便,易于数值求解。所提出的先进行常规求解,由常规解推演出搜索范围,而后进行遗传迭代搜索的方法结构简单、能实时在线检测、非接触及高精度等特点,对于其他图像模型的参数求解也具有很大的意义。更多还原

【Abstract】 Aim at the particularity of situation Registration in LED chip testing system, the adaptive location registration model i built. It puts forward a method of step by step calculate and the parameter is optimized by genetic algorithm. This method can re solve the question of non-linear in normal method. The result show this model and solution fulfill the demand of situation registration in LED chip testing system. The calculation is simple and is prone to gain the numerical value solution. The developed method ha the advantages of simple constitution, real time on line measurement, no contact and high precision and has great significance in oth er image model parameter solution.更多还原