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基于CQFP 64线外壳的封装寄生参数研究
Study on Parasitic Effect of Packaging Based on CQFP 64-Lead Package
【摘要】 封装寄生效应对高频器件性能的影响越来越明显。为了在高频器件设计中充分考虑寄生参数的影响,需对封装的寄生效应进行模拟,以便保持高频电路封装后信号的完整性。利用An-fost公司的软件Q3D和HFSS,对CQFP 64管壳的引脚和键合线进行电磁仿真分析,提取出三维封装结构的RLC参数和高频下的S参数;分析管壳在封装前后、不同频率、不同封装环境下寄生参数的变化情况;将仿真结果与实验结果进行了对比,为设计人员设计产品提供依据。
【Abstract】 Parasitic effects of packaging have significant effect on performance of RF IC’s.A 3-D modeling was made on CQFP 64-lead package using Q3D and HFSS of Ansoft to analyze its parasitic parameters.Based on RLC and S parameters extracted from modeling,variation of parasitic parameters of CQFP 64-lead package before and after packaging at different frequencies and under different packaging environments was discussed.And finally,a comparison was made between simulation and experimental results to provide reference for designers.
【Key words】 Electronic packaging; High frequency packaging; Parasitic effect;
- 【文献出处】 微电子学 ,Microelectronics , 编辑部邮箱 ,2008年04期
- 【分类号】TN405
- 【被引频次】2
- 【下载频次】182