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基于CQFP 64线外壳的封装寄生参数研究

Study on Parasitic Effect of Packaging Based on CQFP 64-Lead Package

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【作者】 徐炀李茂松陈鹏黄大志

【Author】 XU Yang,LI Maosong,CHEN Peng,HUANG Dazhi(Sichuan Institute of Solid State Circuits,China Electronics Technology Group Corporation,Chongqing 400060,P.R.China)

【机构】 中国电子科技集团公司第二十四研究所

【摘要】 封装寄生效应对高频器件性能的影响越来越明显。为了在高频器件设计中充分考虑寄生参数的影响,需对封装的寄生效应进行模拟,以便保持高频电路封装后信号的完整性。利用An-fost公司的软件Q3D和HFSS,对CQFP 64管壳的引脚和键合线进行电磁仿真分析,提取出三维封装结构的RLC参数和高频下的S参数;分析管壳在封装前后、不同频率、不同封装环境下寄生参数的变化情况;将仿真结果与实验结果进行了对比,为设计人员设计产品提供依据。

【Abstract】 Parasitic effects of packaging have significant effect on performance of RF IC’s.A 3-D modeling was made on CQFP 64-lead package using Q3D and HFSS of Ansoft to analyze its parasitic parameters.Based on RLC and S parameters extracted from modeling,variation of parasitic parameters of CQFP 64-lead package before and after packaging at different frequencies and under different packaging environments was discussed.And finally,a comparison was made between simulation and experimental results to provide reference for designers.

  • 【分类号】TN405
  • 【被引频次】2
  • 【下载频次】182
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