【摘要】 目的研究儿童房间隔缺损(atrial septal defect,ASD)堵闭术前和术后血镍浓度的变化。方法2006年在广东省心血管病研究所心儿科行房间隔缺损封堵术52例,年龄3～14岁,使用Amplatzer房间隔缺损封堵器25例,使用国产先健房间隔缺损封堵器27例,采用酶消解电感耦合等离子体(inductive coupled plasma emission spectrometer,ICP)质谱法(ICP-MS)测量血镍。结果房间隔缺损堵闭术后24h和第1个月,血镍均有明显升高,在第1个月时达到最高值,第3个月后开始下降,6～9个月回到堵闭前水平。结论房间隔缺损堵闭术后血镍暂时升高,随着封堵器表面内皮化的形成,血镍可逐渐下降至术前水平。更多还原

【Abstract】 Objectives To investigate the changes of blood nickel levels before and after transcatheter closure for atrial septal defect in children.Methods Transcatheter closure for secundum atrial septal defect was performed in 52 patients, aged from 3 to 14 years, in 2006, including 27 cases with domestic device and 25 cases with amplatzer.The blood nickel concentrations were determined before and after occluder implantation by inductive coupled plasma emission spectrometer.Results The blood nickel concentrations heightened after occluder implantation at the first day, reached a peak concentration at the first month after implantation, descended at the third month, and then got to baseline from 6th to 9th month.Conclusions Blood nickel concentrations increase temporarily following occluder implantation due to the release from the device, but it decrease to baseline if the endothelialization has been completed.更多还原