【摘要】 为实现对高功率半导体激光器快速、有效、无损的质量检测和可靠性筛选,对器件进行了电导数和光导数测试及分析。结果表明高功率半导体激光器的结电压饱和特性与其质量和可靠性紧密相关。结电压饱和特性不好的器件一般都存在某种缺陷,结电压饱和特性的差异超出一定范围的同种类器件一定是质量和可靠性差的器件。因此,阈值处电导数曲线的下沉高度h值可作为器件筛选的一个判据。用模拟测量的方法,对阵列器件和组成它的单元器件的电压饱和特性的相关性进行了研究,阵列器件的电压饱和特性与组成它的单元器件的一致性(均匀性)紧密相关。均匀性不好的器件的电压饱和特性也不好。更多还原

【Abstract】 To distinguish the different reliability and quality of the high power laser diodes facilely,efficiently and nondestructively,some high power laser diode devices were measured and studied with electrical and optical derivative techniques.The results show that the value of junction voltage saturation is a valuable parameter.It closely relates with the quality and reliability of the high power semiconductor laser.The devices with poor junction voltage saturation have so certain defect.For a certain kind of devices,the values of junction voltage saturation are in a certain range.And the device with the values overstepping the range is an unqualified device.Thus,the h value of the dip at the threshold is a valuable parameter to judge the device quality.Furthermore,the laser diode array simulated with shunt-wound laser diodes was measured.The relation between cells which compose array laser and array laser itself was studied.The results show that the junction voltage saturation of the laser diode array is correlated closely with the uniformity of its cells.If the uniformity of the cells composing the laser diode array was bad,the laser diode array itself is sure to have poor junction voltage saturation.更多还原