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1300nm超辐射发光二极管寿命测试
Lifetime Tests of 1300 nm Superluminesent Diodes
【摘要】 作为光纤陀螺用光源的超辐射发光二极管(SLD)随着工作时间的延续,其性能会发生退化。采用加速老化的实验方法来估算InGaAsP SLD管芯的工作寿命。分别在环境温度373 K和358 K下对5只SLD管芯进行加速老化,并通过对P-t曲线拟合来推算和估计管芯的老化速率和激活能。计算出了器件的激活能平均值约为0.82 eV,SLD管芯在室温下的工作寿命超过106h,可以满足光纤陀螺用光源的寿命要求。对影响SLD管芯可靠性的因素以及管芯的退化机理进行了分析,为研制高可靠性的超辐射发光二极管提供了理论基础。
【Abstract】 Superluminescent diode(SLD) for the light source of fiber-optic gyroscope(FOG) will degrade along with the operating time elapse.Operating lifetime of fine SLDs has been estimated from the results of accelerated aging carried out for 3500 h at the ambient temperature of 373K and 358K respectively and the aging rate and active energy were estimated from power-time(P-t) curve fitting.The value of active energy is determined to be 0.82 eV and mean lifetime in practical operation at driving current of 100 mA and an ambient temperature of 298 K is over 106 h,and high reliability and long lifetime required for light source of FOG are confirmed.The degrading mechanism of 1300 nm SLDs was analyzed for developing high reliability devices.
【Key words】 optical device; superluminescent(SLD); lifetime; tests; active energy;
- 【文献出处】 光学学报 ,Acta Optica Sinica , 编辑部邮箱 ,2008年10期
- 【分类号】TN312.8
- 【被引频次】18
- 【下载频次】328