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1300nm超辐射发光二极管寿命测试

Lifetime Tests of 1300 nm Superluminesent Diodes

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【作者】 孙孟相谭满清王鲁峰

【Author】 Sun Mengxiang Tan Manqing Wang Lufeng(Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China)

【机构】 中国科学院半导体研究所

【摘要】 作为光纤陀螺用光源的超辐射发光二极管(SLD)随着工作时间的延续,其性能会发生退化。采用加速老化的实验方法来估算InGaAsP SLD管芯的工作寿命。分别在环境温度373 K和358 K下对5只SLD管芯进行加速老化,并通过对P-t曲线拟合来推算和估计管芯的老化速率和激活能。计算出了器件的激活能平均值约为0.82 eV,SLD管芯在室温下的工作寿命超过106h,可以满足光纤陀螺用光源的寿命要求。对影响SLD管芯可靠性的因素以及管芯的退化机理进行了分析,为研制高可靠性的超辐射发光二极管提供了理论基础。

【Abstract】 Superluminescent diode(SLD) for the light source of fiber-optic gyroscope(FOG) will degrade along with the operating time elapse.Operating lifetime of fine SLDs has been estimated from the results of accelerated aging carried out for 3500 h at the ambient temperature of 373K and 358K respectively and the aging rate and active energy were estimated from power-time(P-t) curve fitting.The value of active energy is determined to be 0.82 eV and mean lifetime in practical operation at driving current of 100 mA and an ambient temperature of 298 K is over 106 h,and high reliability and long lifetime required for light source of FOG are confirmed.The degrading mechanism of 1300 nm SLDs was analyzed for developing high reliability devices.

  • 【文献出处】 光学学报 ,Acta Optica Sinica , 编辑部邮箱 ,2008年10期
  • 【分类号】TN312.8
  • 【被引频次】18
  • 【下载频次】328
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