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一种多端口器件测量技术

A Multiport Device Measurement Technique

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【作者】 徐丽黄成徐佳刘志明吴建辉

【Author】 XU Li HUANG Cheng XU Jia LIU Zhiming WU Jianhui (National ASIC System Engineering Research Center,Southeast University,Nanjing,210096,CHN)

【机构】 东南大学国家专用集成电路系统工程技术研究中心

【摘要】 给出了一种用二端口矢量网络分析仪(VNA)对多端口器件进行测量的方法,该方法运用简单的迭代法,减小由于其余端口所接负载的非匹配性引入的误差,易于通过软件实现。利用该方法对三端口器件巴伦进行测量,并将最后结果与三端口VNA测得的结果进行比较。比较结果表明,幅度误差小于0.2dB,相位误差小于3°。该方法在多端口VNA不可获得的情况下,可以应用到多端口器件的精确测量上。

【Abstract】 A method for multiport device measurement by using a two-port vector network analyzer (VNA) is presented in this paper. This method uses a simple iterative algorithm to reduce the error due to imperfect terminations of the remaining ports. It can be easily implemented in software. A three-port balun transformer was measured using this method and the results were compared to the data measured using a three-port VNA. The compared results show that the error of the amplitude is less than 0.2dB and the error of the phase is less than 3 degree. In addition,this method is precise on multiport device measurement when multiport VNAs are not available.

  • 【文献出处】 固体电子学研究与进展 ,Research & Progress of SSE Solid State Electronics , 编辑部邮箱 ,2008年04期
  • 【分类号】TN307
  • 【被引频次】3
  • 【下载频次】109
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