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基于LabVIEW的多路LED老化实时测量系统

Real-time multiplex-channels measuring system for LED aging based on LabVIEW

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【作者】 苏佳槟吴杜雄曾亚光李炳乾

【Author】 SU Jia-bing,WU Du-xiong,ZENG Ya-guang,LI Bing-qian (Department of optoelectronics and Physics, Foshan University,Guangdong Foshan 528000,China)

【机构】 佛山科学技术学院光电子与物理学系

【摘要】 介绍一种基于LabVIEW平台的多路LED老化实时测量系统。该系统由LabVIEW、阿尔泰PCI2300数据采集卡构成,能够长时间不间断地测量、记录LED光强的变化,不仅能够将光强随时间的微小变化记录下来,而且避免了传统老化方法频繁关断对测量结果的影响。系统软件允许根据具体情况输入相应的校正公式,将光电探测器的输出电压转换为所测量的光学参数,并对其进行线性校准。

【Abstract】 A Multiplex-channel real-time Light emitting diodes(LED) aging system based on LabVIEW is reported.The system is built up with LabVIEW,data acquisition card(DAQ) PCI-2003(art).The fine light intensity changing through time of LED could be measured and recorded by the system,and then the shortcoming of tradition aging methods,continually on-off influence on aging characteristics,is overcome.Moreover,The revise formula can be input at the friendly user interface,the output voltage data given by opto-electronic detectors can be easily transform to optical parameters,and the nonlinear output characteristics of the detectors can be revised at the same time.

【关键词】 LabVIEW发光二极管老化
【Key words】 LabVIEWlight emitting diodesaging
  • 【文献出处】 仪器仪表用户 ,Electronic Instrumentation Customer , 编辑部邮箱 ,2008年04期
  • 【分类号】TP274
  • 【下载频次】183
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