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采用EBSD方法研究高纯Al溅射靶材的微观结构
Study on the microstructure of high purity aluminum sputtering targets by EBSD method
【摘要】 高纯Al溅射靶材在电子信息产品制造业有着广泛应用。微观结构与组织的均匀性、晶粒尺寸和取向分布对高纯Al溅射靶材的性能有很大的影响。本文采用EBSD技术对高纯Al溅射靶材的晶粒取向分布进行了分析,探索了晶粒取向与溅射速率关系,并采用EBSD大面积扫描对高纯Al溅射靶材的晶粒尺寸及微观结构与组织均匀性进行了研究。
【Abstract】 High purity aluminum sputtering targets are widely used in electronic message industry.The function of high purity aluminum sputtering targets is seriously affected by the homogeneity of microstructure,grain size and orientation distribution of grains.In this paper,the orientation and size distributions of high purity aluminum sputtering targets grains were analyzed by EBSD method,the relationship between the orientation distribution of grains and the sputtering velocity of targets was discussed.
【关键词】 高纯Al;
靶材;
晶粒取向;
EBSD;
【Key words】 high purity aluminum; sputtering target; grain orientation; EBSD;
【Key words】 high purity aluminum; sputtering target; grain orientation; EBSD;
- 【文献出处】 电子显微学报 ,Journal of Chinese Electron Microscopy Society , 编辑部邮箱 ,2008年06期
- 【分类号】TG146.21
- 【被引频次】8
- 【下载频次】346