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ZnO纳米棒中结的透射电镜研究

TEM research on the collision-induced junction during the growing process on ZnO nanorods

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【作者】 章新政单旭东尤力平俞大鹏

【Author】 ZHANG Xin-zheng,SHAN Xu-dong,YOU Li-ping,YU Da-peng(School of Physics,Electron Microscopy Laboratory,Peking University,Beijing 100871,China)

【机构】 北京大学物理学院北京大学电子显微镜实验室

【摘要】 本文采用化学气相沉积法制得大量ZnO纳米棒,利用会聚束电子衍射(CBED)研究了纳米棒的生长方向,验证了纳米棒在生长过程中产生碰撞。通过TEM研究发现,纳米棒沿c轴生长,碰撞形成的晶界并不是一个随机取向的大角晶界,为了降低能量,晶界具有孪晶关系。晶界的存在导致晶体产生缺陷生长,使纳米棒的结的附近区域长粗。

【Abstract】 ZnO nanorods were synthesized via simple chemical vapor deposition method(CVD).The nanorods collided with each other during the growing process and formed the junctions.Further TEM research on these junctions indicates that the nanorods grew along the c axis.The junctions were formed due to the collision in the growing process,which was proved by the characterization of the growing direction of the nanorods via converged-beam electron diffraction(CBED).The grain boundary due to the collision tended to form twin boundary as energy favorite and led a defect growth at the junction.As a result,the nanorods around the junction became thick.

【关键词】 孪晶碰撞氧化锌纳米棒会聚束
【Key words】 twin boundarycollisionZnOnanorodCBED
【基金】 国家重点基础研究发展计划973项目(2002CB613505)
  • 【文献出处】 电子显微学报 ,Journal of Chinese Electron Microscopy Society , 编辑部邮箱 ,2008年05期
  • 【分类号】TB383.1
  • 【被引频次】2
  • 【下载频次】359
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