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基于SEM纳米级电子束曝光机的快速束闸设计
The Design of Fast Beam Blanker for Nano E-beam Lithography Based on SEM
【摘要】 基于扫描电镜(SEM)的纳米级电子束曝光系统能够以较低成本满足科研单位对纳米加工设备的需求。在电子束曝光系统中,需要快速束闸控制电子束通断以实现纳米图像的多场曝光。从安装位置、机械结构和驱动器等方面讨论快速束闸的设计。
【Abstract】 Nanometer E-beam lithography based on SEM can meet the need of nanofabrication research and design activities at low price. Fast beam blanker is needed when a nano-pattern with more one writing field in E-beam lithography. This paper presented the design of fast beam blanker from the placing position, structure and its driver with examples.
【关键词】 电子束曝光;
束闸;
扫描电子显微镜;
图形发生器;
【Key words】 E-beam lithography; beam blanker; scanning electron microscope(SEM); pattern generator;
【Key words】 E-beam lithography; beam blanker; scanning electron microscope(SEM); pattern generator;
- 【文献出处】 电子工业专用设备 ,Equipment for Electronic Products Manufacturing , 编辑部邮箱 ,2008年10期
- 【分类号】TN305.7
- 【被引频次】2
- 【下载频次】182