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铝硅合金中共晶硅的变质机理:杂质诱发共生成对孪晶

Modification mechanism of eutectic silicon in Al-Si alloys:impurity-induced coupled twinning

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【作者】 董光明孙国雄廖恒成韩正铜

【Author】 DONG Guang-ming1,2,SUN Guo-xiong1,LIAO Heng-cheng1,HAN Zheng-tong2(1.School of Material Science and Engineering,Southeast University,Nanjing 210018,China; 2.School of Mechanical and Electrical Engineering,China University of Mining and Technology,Xuzhou 221008,China)

【机构】 东南大学材料科学与工程学院中国矿业大学机电工程学院 江苏南京210018中国矿业大学机电工程学院江苏徐州221008江苏南京210018

【摘要】 为探讨铝硅合金中共晶硅的变质机理,根据杂质诱发共生成对孪晶的理论,对共晶硅的变质机理进行了分析.结果表明:杂质原子诱发的共生成对孪晶之一使得共晶硅在平行于{111}晶面的方向以TPRE的机制生长,而共生成对孪晶中的另一处与原{111}晶面夹角为109.5°的孪晶,则使得共晶硅垂直于{111}晶面方向的生长也按照TPRE机制进行;共生成对孪晶大大加快了共晶硅垂直于{111}晶面方向的生长,并大大降低{111}晶面厚度方向的生长速度与平行于{111}晶面的生长速度的差异,从根本上改变了共晶硅生长时的各向异性特点,使得共晶硅以各向同性方式生长,最终长成纤维状.

【Abstract】 In order to discuss modification mechanism of eutectic silicon in Al-Si alloys,based on the theory of coupled twinning induced by impurity atom,modification mechanism of eutectic silicon in Al-Si alloys was analyzed.Results indicated that one of the coupled twinnings made eutectic silicon grow parallel to {111} plane by TPRE mechanism,meanwhile the other of the coupled twinnings with an angle of 109.5° to the original {111} plane made eutectic silicon grow perpendicular to {111} plane by TPRE mechanism as well.Thus the coupled twinnings can greatly increase growth speed of eutectic silicon in the direction of vertical to the {111} plane,and greatly reduced the difference between the growth speed vertical to the {111} plane and that parallel to the {111} plane.Therefore the coupled twinning can eliminate anisotropy of eutectic silicon growth on the whole,which leads to the eutectic silicon changes from flake into fiber.

【关键词】 变质铝硅合金共生成对孪晶TPRE
【Key words】 modificationAl-Si alloycoupled twinningTPRE
【基金】 江苏省自然科学基金资助项目(BK2004069)
  • 【文献出处】 材料科学与工艺 ,Materials Science and Technology , 编辑部邮箱 ,2008年01期
  • 【分类号】TG146.21
  • 【被引频次】29
  • 【下载频次】620
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