【摘要】 纳米阻抗显微镜(Nanoscale impedance microscopy,NIM)能够测量材料表面的纳米微区阻抗性质,已经成为纳米材料表征的重要工具,得到越来越多的应用;但其应用目前仅局限于实验室范围,而国内尚未有纳米阻抗显微镜研究的文献报道。本文主要介绍纳米阻抗显微镜的基本原理及其仪器的研制。以国内外现有的扫描探针显微镜仪器为基础,研制出了两套不同的纳米阻抗显微镜样机,并率先实现了这种技术的商品化,还利用该技术开展了氧化锌多晶陶瓷材料的应用研究。更多还原

【Abstract】 Nanoscale impedance microscopy(NIM),which can measure the local impedance of material surface,is an important instrument for material characterization on nanoscale.The application of NIM has been greatly extended recently overseas though still limited on laboratories though no reference about it was found domestically.In this paper,the principle of NIM is introduced and its realization is presented.Base on commercial scanning probe microscopies(SPM),two various NIM were developed and the commercialization of NIM came true for the first time with a home-made SPM.The application of this technique was demonstrated with ceramic materials such as polycrystalline ZnO.更多还原