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SiO2陶瓷与TC4钛合金的钎焊研究
Research on the Brazing of SiO2 Ceramic to TC4 Alloy
【摘要】 采用AgCu共晶钎料钎焊SiO2陶瓷与TC4钛合金,形成了良好接头。通过扫描电镜(SEM),能谱分析(EDS)以及X射线衍射分析(XRD)明确了接头生成物,确定了接头界面结构为TC4/Ti2Cu+Ti(s.s)/Ti2Cu/TiCu+Ti3Cu4+Ag(s.s)/Ag(s.s)+Cu(s.s)+TiCu/TiCu+Cu2Ti4O/Al2(SiO4)O+TiSi2/SiO2。研究了钎焊温度和保温时间对界面的影响,结果表明:当钎焊温度为850℃,保温时间为5min时,接头抗剪强度最高,其值为30MPa。
【Abstract】 SiO2 glass ceramic was successfully joined to TC4 alloy using a commercially available AgCu filler foil by vacuum brazing.Joint interface was identified by several analysis methods,such as SEM,EDS and XRD.The typical interface structure is TC4/Ti2Cu+Ti(s.s)/Ti2Cu/ TiCu+Ti3Cu4+Ag(s.s)/Ag(s.s)+Cu(s.s)+TiCu/TiCu+Cu2Ti4O/Al2(SiO4)O+TiSi2/SiO2 from TC4 alloy to SiO2 glass ceramic side.The effect of brazing parameters on joint interface was studied.According to the experimental results,the joint brazed at 850℃ for 5min has the maximum shear strength of 30MPa.
【Key words】 SiO2 glass ceramic; brazing; interface structure; shear strength;
- 【文献出处】 材料工程 ,Journal of Materials Engineering , 编辑部邮箱 ,2008年09期
- 【分类号】TG454
- 【被引频次】10
- 【下载频次】438