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射频功率HBT热稳定性分析及镇流电阻优化

Thermal Stability Analysis of RF Power HBT and Ballasting Resistor Optimum for the Self-heating Effect Compensation

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【作者】 金冬月张万荣谢红云沈珮王扬

【Author】 JIN Dong-yue ZHANG Wan-rong XIE Hong-yun SHEN Pei WANG Yang (College of Electronic Information and Control Engineering,Beijing University of Technology,Beijing 100022,China)

【机构】 北京工业大学电子信息与控制工程学院北京工业大学电子信息与控制工程学院 北京 100022北京 100022

【摘要】 为了有效改善射频功率HBT的热不稳定性、消除自加热效应对功率器件电学特性的影响,从热电反馈网络出发,阐述了晶体管热稳定因子S的物理意义.在考虑发射极电流正温度系数、器件能带连续性(△E_v)、重掺杂效应(△E_g)、基极和发射极加入镇流电阻(R_B和R_E)等因素的情况下。给出了功率HBT自热完全补偿(S= 0)所需最小镇流电阻(R_c)表达式.结果表明,在△E_v+△E_g>2κT时,HBT工作温度丁越大,R_c反而越小.由于R_c的减小,功率HBT将能提供更大的输出功率、功率增益和功率附加效率.

【Abstract】 In order to improve the thermal stability of RF power HBT and eliminate the self-heating effect which degenerates the transistor’s electrical characteristics,the physical significance of thermal stability factor S is presented in detail based on the thermal-electric feedback network analysis.Furthermore,the expression of the minimum ballasting resistance R_C of HBT to compensate the self-heating effect(S=0)is presented by taking into account of the temperature dependence of emitter current,the valence-band discontinuity at emit- ter junction(△E_v),the bandgap narrowing due to heavy doping(△E_g),additional ballasting resistance in emitter and base.It is found that the higher the temperature T is,the smaller the minimum ballasting resis- tance R_C to compensate the self-heating effect is under the condition that(△E_v+△E_g)>2KT.Owing to the reducing of ballasting resistance,RF power HBT will provide higher output power,power gain,and power- added efficiency(PAE)in an amplifier block.

【基金】 北京市教委科技发展计划资助项目(KM200710005015);国家自然基金科学基金(60776051,60376033);北京市自然科学基金(4082007);北京市优秀跨世纪人才基金(67002013200301);北京市属市管高校中青年骨干教师培养计划资助项目(102(KB)-00856)
  • 【文献出处】 北京工业大学学报 ,Journal of Beijing University of Technology , 编辑部邮箱 ,2008年02期
  • 【分类号】TN322.8
  • 【被引频次】3
  • 【下载频次】177
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