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模拟集成电路参数型故障定位方法

A Method to Locate Parametric Faults in Analog Integrated Circuits

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【作者】 谢永乐; 李西峰;

【Author】 Xie Yongle and Li Xifeng(School of Automation Engineering,University of Electronic Science and Technology,Chengdu 610054,China)

【机构】 电子科技大学自动化工程学院; 电子科技大学自动化工程学院 成都610054; 成都610054;

【摘要】 针对模拟集成电路参数型故障的测试难题,提出了定位模拟集成电路参数型故障的功率谱相关分析方法.利用小波滤波器组对被测电路响应进行子带滤波后,计算子带响应序列的相干函数.通过对以相干函数序列表征的功率谱进行相关分析,不仅可以实现模拟集成电路参数型故障的数字化故障特征提取,而且还可以完成对参数型故障的定位.利用国际标准电路ITC97的状态变量滤波器和跳蛙滤波器,通过对比实验,验证了本文方法对定位参数型故障的有效性,为实现模拟集成电路参数型故障诊断的高覆盖率和诊断自动化提供了一种新途径.

【Abstract】 Aiming at the problem of testing parametric fault in analog integrated circuits,an approach based on power spectrum correlation analysis for diagnosing parametric faults is presented.After wavelet filter-banks’ filtering,the coherence function of the sub-band response sequence is computed.Subsequently,correlation analysis is imposed upon the power spectrum described by the coherence function sequence.As a result,not only can extracting the digital signature of the parametric fault be completed,but also the location of the parametric fault can be found.By virtue of international benchmark circuits,state variable filter,and leapfrog filter,the effectiveness of this approach with respect to locating parametric faults is validated by comparison with that in Ref.[8].This provides a novel way to realize high fault coverage and automation of diagnosing parametric faults in analog integrated circuits.

【基金】 国家自然科学基金资助项目(批准号:90407007)~~
  • 【文献出处】 半导体学报 ,Journal of Semiconductors , 编辑部邮箱 ,2008年03期
  • 【分类号】TN43
  • 【被引频次】17
  • 【下载频次】414
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