【摘要】 气溶胶样品中Z>12以上元素含量的质子荧光(PIXE)分析是北京师范大学GIC4117串列加速器的主要应用领域之一。为弥补PIXE无法分析H、C、N和O等轻元素之不足,在PIXE靶室160°散射角安装金硅面垒探测器,用质子非卢瑟福背散射分析(PNBS)方法对核孔膜采集的气溶胶样品中H、C、N和O等轻元素的含量进行测量。测量得到的气溶胶样品中H和Si元素含量与质子前角散射(PESA)和PIXE的分析结果相近,表明PNBS可用于核孔膜采集的气溶胶样品的分析。更多还原

【Abstract】 Particle induced X-ray emission(PIXE)analysis of aerosol samples for measur- ing concentrations of elements with Z>12 is one of major applications at the GIC4117 Tandetron at Beijing Normal University.In order to measure H,C,N and O concentra- tions in aerosol samples,proton non-Rutherford backscattering spectrometry(PNBS) was employed with an Au(Si)surface barrier detector at an angle of 160°in PIXE cham- ber.PNBS spectra of 4 aerosol samples collected on nuclepore filters were fitted with SIMNRA.H and Si concentrations are comparable with those of proton elastic scatter- ing analysis(PESA)and PIXE,which indicates that PNBS can be used for the analysis of aerosol samples collected on nuclepore filters.更多还原