节点文献

加热去氩处理工艺对离子束混合沉积的C-SiC涂层阻氢性能的影响

Effect of Eliminating Argon by Heat-Treatment on Hydrogen Resistance of C-SiC Films Deposited by Ion Beam Mixing

  • 推荐 CAJ下载
  • PDF下载
  • 不支持迅雷等下载工具,请取消加速工具后下载。

【作者】 任丁张瑞谦黄宁康曾俊辉杜良张东

【Author】 RENDing ZHANG Rui-qian HUANG Ning-kang Key Lab for Radiation Physics and Technology of Education Ministry of China,Institute of Nuclear Science and Technology,Sichuan University,Chengdu 610064,China; ZENG Jun-hui DU Liang ZHANG Dong Institute of Nuclear Physics and Chemistry,China Academy of Engineering and Physics,Mianyang 621900,China

【机构】 四川大学原子核科学技术研究所教育部辐射物理和技术重点实验室中国工程物理研究院核物理与化学研究所中国工程物理研究院核物理与化学研究所 四川成都610064四川成都610064四川绵阳621900

【摘要】 利用Ar~+离子束混合技术在不锈钢基体上沉积C-SiC涂层,然后对部分样品进行加热去氩处理(400℃,30min),再用5keV氢离子源辐照样品。通过扫描电镜(SEM)的表面形貌观察、二次离子质谱仪(SIMS)的H与Ar元素深度分布和正离子质谱分析,研究去氩处理对氢离子辐照的C-SiC涂层的形貌和阻氢性能的影响。结果表明,经去氩处理,样品中不锈钢基体内的氢浓度降低了80%,显示出去氩处理的C-SiC涂层具有更高的阻氢性能。研究结果将为该技术应用于不锈钢基体上C-SiC涂层制备工艺的进一步改善提供依据。

【Abstract】 C-SiC films were deposited on the surface of stainless steel using ion beam mixing.In order to eliminate argon,some of the samples were heat-treated for 30 min at 400℃before all were irradiated by 5 keV hydrogen ion beam.Scanning electron micro- scope(SEM)was used to analyze surface microtopology.Secondary ion mass spectrom- etry(SIMS)was used to analyze the depth distribution of H and Ar and mass spectra of positive species.The effect of eliminating argon by heat-treatment on the surface struc- ture and hydrogen resistance of C-SiC films was studied.It is found that the concentra- tion of hydrogen in stainless steel substrates after eliminated argon by heat-treatment is reduced 80%.This means that the technical of eliminating argon by heat-treatment can effectively improve hydrogen resistance of C-SiC films,which offers the theory proof of technical improvement in practical application.

【基金】 国家自然科学基金资助项目(59781002);中国工程物理研究院基金资助项目;四川大学协作项目
  • 【文献出处】 原子能科学技术 ,Atomic Energy Science and Technology , 编辑部邮箱 ,2007年05期
  • 【分类号】TL933
  • 【被引频次】2
  • 【下载频次】86
节点文献中: 

本文链接的文献网络图示:

本文的引文网络