节点文献
加热去氩处理工艺对离子束混合沉积的C-SiC涂层阻氢性能的影响
Effect of Eliminating Argon by Heat-Treatment on Hydrogen Resistance of C-SiC Films Deposited by Ion Beam Mixing
【摘要】 利用Ar~+离子束混合技术在不锈钢基体上沉积C-SiC涂层,然后对部分样品进行加热去氩处理(400℃,30min),再用5keV氢离子源辐照样品。通过扫描电镜(SEM)的表面形貌观察、二次离子质谱仪(SIMS)的H与Ar元素深度分布和正离子质谱分析,研究去氩处理对氢离子辐照的C-SiC涂层的形貌和阻氢性能的影响。结果表明,经去氩处理,样品中不锈钢基体内的氢浓度降低了80%,显示出去氩处理的C-SiC涂层具有更高的阻氢性能。研究结果将为该技术应用于不锈钢基体上C-SiC涂层制备工艺的进一步改善提供依据。
【Abstract】 C-SiC films were deposited on the surface of stainless steel using ion beam mixing.In order to eliminate argon,some of the samples were heat-treated for 30 min at 400℃before all were irradiated by 5 keV hydrogen ion beam.Scanning electron micro- scope(SEM)was used to analyze surface microtopology.Secondary ion mass spectrom- etry(SIMS)was used to analyze the depth distribution of H and Ar and mass spectra of positive species.The effect of eliminating argon by heat-treatment on the surface struc- ture and hydrogen resistance of C-SiC films was studied.It is found that the concentra- tion of hydrogen in stainless steel substrates after eliminated argon by heat-treatment is reduced 80%.This means that the technical of eliminating argon by heat-treatment can effectively improve hydrogen resistance of C-SiC films,which offers the theory proof of technical improvement in practical application.
【Key words】 C-SiC films; ion beam mixing; hydrogen resistance; scanning electron microscope; secondary ion mass spectrometry;
- 【文献出处】 原子能科学技术 ,Atomic Energy Science and Technology , 编辑部邮箱 ,2007年05期
- 【分类号】TL933
- 【被引频次】2
- 【下载频次】86