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利用原子芯片上Z形磁阱囚禁中性87Rb原子
A Z-trap in an atom chip for trapping neutral 87Rb atoms
【摘要】 利用解析和数值方法计算了Z形磁阱的囚禁势,发现当囚禁中心和芯片表面距离较远时(该距离和Z形线中部导线的一半长度相差不超过一个量级),势阱的深度不能近似表示成偏置磁场By对应的能量,而要减去囚禁中心的势能高度;而增加By进行磁阱压缩到一定值时,势阱深度反而会下降.此外介绍了原子芯片的制作方法,以及利用原子芯片上Z形磁阱囚禁中性87Rb原子的实验装置和实验过程.最终有2×106个87Rb原子被转移到Z形磁阱中.
【Abstract】 Trapping potential of a Z-trap is calculated with analytic and numeric methods.It’s found that when a trapping center is a little bit far from the chip surface(the distance is about one order of the half length of the Z-wire central part),the trapping depth is not approximately eqsual to the potential B_y created by a bias magnetic field,the potential energy at the trapping center should be subtracted from the potential B_y created by the bias field.On the other hand,if an atom cloud is compressed to a certain extent by increasing B_y,the trapping depth will be decreased rather than increased.The preparation of the Z-trap in an atom chip,the experimental setup,and the experimental procedure for trapping neutral 87Rb atoms is also introduced.At last we obtained 2×106 87Rb atoms trapped in the Z-trap.
- 【文献出处】 物理学报 ,Acta Physica Sinica , 编辑部邮箱 ,2007年11期
- 【分类号】O562
- 【被引频次】3
- 【下载频次】159