【摘要】 通过电磨损性能测试和扫描电子显微镜(SEM)测试等方法,对聚合物基电接触材料的低压受流磨损性能进行了研究,探讨了聚合物基电接触材料/铜的受流磨损机理。结果表明:PBMI/YM聚合物基电接触材料的受流耐磨性明显优于YM聚合物基电接触材料。研究发现,在环境温度为(25±2)℃时,在96 V电压下,通电3 600 s, YM聚合物基电接触材料的磨损率为3.47×10-4mm/s,而PBMI/YM聚合物基电接触材料为2.63×10-4mm/s。在受流磨损过程中,聚合物基电接触材料/铜的磨损机制主要是氧化磨损,同时伴随着粘着磨损、疲劳磨损和磨粒磨损。更多还原

【Abstract】 The electrical wear behavior of the polymer-matrix contact material at low -voltage with current was studied using an electric wear testing configuration and scanning electron microscope (SEM) . The wear mechanism of the polymer-matrix contact material/copper with current was analyzed and discussed. The experiment results indicate that the wear resistance of the PBMI/YM contact material with current is better than that of the YM contact material under the same conditions. It has also been found that, at environment temperature (25±2)℃and 96 V for 3 600 s, the wear rate of the YM polymer - matrix contact material is 3.47×10-4 mm/s. While that of the PBMI/YM polymer - matrix contact material is 2.63×10-4 mm/s. The wear mechanism of the polymer-matrix contact material/copper is the characteristic of oxidation wear, which accompanied adhesion wear, fatigue wear and abrasive wear during the process of wear with current更多还原