【摘要】 研究了BGO晶体固/液边界层及其两侧晶体和熔体的高温拉曼光谱,分析了BGO晶体生长固/液边界层以及边界层两侧晶体和熔体的结构特征。结果显示,桥氧键Bi-O-Ge和O-Bi-O在晶体和边界层中都存在,而在熔体中消失。说明[GeO4]和[BiO6]结构基团在晶体及边界层中都存在,边界层中的结构已接近晶体结构;但在熔体中[GeO4]结构基团和Bi3+却是两种独立的存在,长程有序的晶体结构消失。并首次报道了BGO晶体固/液边界层的厚度约为50μm。更多还原

【Abstract】 The high-temperature Raman spectra of the growth solid-liquid boundary layer of BGO crystal were studied.The structure characters in boundary layer,melts and crystal were analyzed.The results show that there exits polyhedral structure and Bi ion independently in BGO melt.The bridge bonds Bi-O-Ge and O-Bi-O are present in both the crystal and boundary layer,but disappear in the melt.The structure of the growth solid-liquid boundary layer is similar to that of BGO crystal.In the melt,the long-range order structure of the crystal disappears.Finally,we obtained the thickness of the growth solid-liquid boundary layer of BGO crystal for first time,it is about 50μm.更多还原