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基于F-P腔法的纳米精度非线性误差校准系统研究
The study on nonlinear error calibrating system based on Fabry-Parot interferometer with an accuracy of nanometer order
【摘要】 为了研究可用于纳米、亚纳米精度的非线性误差校准系统,采用差拍F-P干涉法,在中国计量科学研究院研制的差拍F-P干涉仪基础上,设计并制作了适用于该系统的密封干涉光路的真空系统。通过与电容式测微仪的比对实验,证明了系统的抗干扰能力得到了改善,在大于半波长的测量范围内,系统的非线性度优于3.86nm。
【Abstract】 Heterodyne Fabry-Parot interferometer can be used in the nonlinear error calibration with an accuracy of nanometer and sub-nanometer order.The vacuum system that adjusts the interference light path is designed and built based on NIM’s heterodyne Fabry-Parot interferometer.Comparing with capacitance displacement measurement instrument,the system’s ability of anti-jamming is improved, and the nonlinear degree of this system in the range of longer than half of the wavelength is better than 3.86nm.
【关键词】 纳米测量;
F-P腔;
非线性误差校准;
拍频干涉法;
【Key words】 nanometer measurement; F-P cavity; nonlinear error calibration; beat frequency interferometer;
【Key words】 nanometer measurement; F-P cavity; nonlinear error calibration; beat frequency interferometer;
【基金】 国家自然科学基金资助项目(50410479)和(50575116)
- 【文献出处】 光学技术 ,Optical Technique , 编辑部邮箱 ,2007年05期
- 【分类号】TG801
- 【被引频次】5
- 【下载频次】168