【摘要】 本文论述了将粒子群算法应用在时序电路自动测试生成的研究结果。结合时序电路的特点,构造测试生成的粒子表达方式,建立自动测试生成离散粒子群速度-位置模型,通过群体中粒子间的合作与竞争产生的群体智能指导优化搜索。针对国际标准时序电路的验证结果表明,与同类算法相比,该算法可以获得较高的故障覆盖率和较小的测试矢量集。更多还原

【Abstract】 This paper discussed the results achieved by applying particle swarm optimization algorithm to automatic test pattern generation of sequential circuits. By combining the characteristics of sequential circuits and constructing par-ticle expression of test generation, the paper made the speed-position model of discrete partide swarm optimization for automatic test generation. The optimized search is guided by the swarm intelligent generated from cooperation and competi-tion among particles of swarm. The experimental results for benchmark circuits show that the proposed algorithm can achieve higher fault coverages and more compact test sets when compared to other similar test generation algorithms.更多还原