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ICP-AES法测定铜合金中微量硅
Determination of Trace Silicon in Copper-alloy by ICP-AES
【摘要】 研究了ICP-AES法测定铜合金中微量硅的最优化条件。采取标准加入法消除基体干扰。此方法操作简便,重现性好,回收率为98.7%~102.3%,RSD≤0.0221,测定范围为0.001%~0.5%。
【Abstract】 The conditions for determination of Si in Cooper-alloy by ICP-AES were studied. Interference of base solution can be despeled by standard add. Under the optimum condition, the recoceries of the method is 98.7%~102.3%, 0.001%~0.5% Si can be measured. The method has high good accuracy. (Si in Copper-alloy was measured for 10 times, RSD≤0.022 1). The results are satisfactory.
- 【文献出处】 有色矿冶 ,Non-ferrous Mining and Metallurgy , 编辑部邮箱 ,2005年02期
- 【分类号】TG115.339
- 【被引频次】10
- 【下载频次】89