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X-射线荧光光谱法测定生铁中硅和磷
Determination of silicon and phosphorus in pig iron by XRF
【摘要】 探讨了应用能量色散型X-射线荧光光谱仪测定生铁中硅和磷的炉前快速分析方法。该方法所得测定结果与化学法测定结果或标样认定值相吻合,相对标准偏差小于1.3%,与化学法相比,硅和磷的测定时间由15 min缩短到2 min。
【Abstract】 The rapid determination of silicon and phosphorus in pig iron with polarized EDXRF spectrometer was discussed.The results obtained by this method were in agreement with those by chemical method or certified values.The relative standard deviation was below 1.3%,and the analytical time for Si and P could be shortened from 15 min to 2 min.
【关键词】 偏振式能量色散型X-射线荧光光谱仪;
生铁;
次级靶;
【Key words】 polarized EDXRF spectrometer; pig iron; secondary target;
【Key words】 polarized EDXRF spectrometer; pig iron; secondary target;
- 【文献出处】 冶金分析 ,Metallurgical Analysis , 编辑部邮箱 ,2005年04期
- 【分类号】TG115.3
- 【被引频次】17
- 【下载频次】150