【摘要】 研究了微柱分离 ICP MS测定高纯氧化钐中痕量Dy,Ho,Er,Tm的方法,方法基于采用Cyanex272负载树脂微柱,选定上述杂质与大量基体分离的实验条件,分离周期为32min。最终建立了微柱分离Sm后测定Dy,Ho,Er,Tm,其他稀土杂质用内标补偿ICP MS法直接测定的分析方法。方法测定下限为0.1～5.0μg·g-1,加标回收率为90%～115%,相对标准偏差为0.9%～5.1%。本法可满足快速测定99.999%氧化钐中14个稀土杂质的要求。更多还原

【Abstract】 A method of micro-column separation-ICP-MS determination of trace Dy, Ho, Er, Tm in high purity Sm₂O₃ was studied. By adopting Cyanex 272 loaded resin column and optimizing separation conditions for separating Sm matrix, the separation period was only 32 min. Combined with direct ICP-MS determination of other REE impurities using internal standard method, 14 REE impurities in high purity Sm₂O₃ were determined. The determination limits for REE are 0.1～5.0 μg·g^-1, the precisions of measurement are 0.9%～5.1% RSD and the recoveries of standard addition were 90%～115%. The method is rapid and easy to operate. It has been applied to the determination of REE impurities in high purity Sm₂O₃ with purity of 99.999%.更多还原