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一种实用波导衰减系数测量系统的设计

An Utility Measurement System Design of Waveguide Modulus Decay

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【作者】 黄重庆刘靖

【Author】 HUANG Chongqing 1,LIU Jing 2 (1.Department of Physics and Electronic Information, Hunan Institute of Science and Technology,Yueyang,414006,China;2.Department of Optoelectronic Engineering, Huazhong University of Science and Technology, Wuhan,430074,China)

【机构】 湖南理工学院物理与电子信息系华中科技大学光电子工程系 湖南岳阳414006湖北武汉430074

【摘要】 以波导耦合理论为依据,设计了集光电为一体的波导衰减系数测量系统。测量以激光为光源,采用双光路法,消除了传统检测显示仪由于光源光强不稳定产生的误差,使得测量结果只与光强的相对变化量有关;利用AD538实时模拟计算芯片,提高了计算精度和运算速度;利用常规仪器设备实现了数字化检测显示,避免了人为主观读数产生的误差。该系统亦可应用于介质折射率及分光镜分光比等光学参量的测量。

【Abstract】 This article is based on coupling theory and has been designed the incorporating photoelectricity measuring device of waveguide modulus decay. In the course of testing, the laser is used as light source with twinlight path, the error of lightintensity variation of traditional detection devices is dispelled, the measurement result is only relates to the relative change of optical intensity. The realtime simulation chip of AD538 is used,it has greatly improved the calculation precision and operating speed. The system makes use of some conventional equipment to realize digitized detection display technique and avoid the errors in reading. This system can be also applied to the measurement of optical parameters such as refractometry and light splitting ratio of spectrometer, etc.

【关键词】 波导衰减系数光强AD538
【Key words】 waveguidemodulus decayoptical intensityAD538
  • 【文献出处】 现代电子技术 ,Modern Electronic Technique , 编辑部邮箱 ,2005年12期
  • 【分类号】TN252
  • 【被引频次】2
  • 【下载频次】55
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