【摘要】 基于可复用的嵌入式IP内核模块的系统级芯片(SoC)设计方法使测试面临新的挑战。文章针对IP内核模块测试所面临的技术难点,介绍了IP核模块实现测试所需要构建的硬件环境和通用结构,并以嵌入ARM微处理器核的SoC为例,提出了具体的测试解决方案。更多还原

【Abstract】 The system-on-chip(SoC) based on reusable embedded IP(intellectual property) cores pose new challenge for test. A novel test methodology is described in this paper along with its structure. A typical system on chip(SoC) test carried out at ARM is also presented as a case study.更多还原